Ray tracing simulation: Alignment tolerances in full-field X-ray microscopy

  • Job:

    Ray tracing simulation: Alignment tolerances in full-field X-ray microscopy
  • Faculty / Division:

    Institute of Microstructure Technology
  • Institute:

    KIT
  • Publication Date:

    31.01.2019
  • Contact Person:

    Alexander Opolka
    alexander.opolka@kit.edu
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