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Ray tracing simulation: Alignment tolerances in full-field X-ray microscopy

Ray tracing simulation: Alignment tolerances in full-field X-ray microscopy
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Ray tracing simulation: Alignment tolerances in full-field X-ray microscopy

Faculty / Division:

Institute of Microstructure Technology

Institute:

KIT

Publication Date:

31.01.2019

Contact Person:

Alexander Opolka
alexander.opolka@kit.edu